ISO 18114:2003
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ISO 18114:2003
31693

Estado : Retirada

Esta norma ha sido revisada por ISO 18114:2021

Resumen

ISO 18114:2003 specifies a method of determining relative sensitivity factors (RSFs) for secondary-ion mass spectrometry (SIMS) from ion-implanted reference materials.

The method is applicable to specimens in which the matrix is of uniform chemical composition, and in which the peak concentration of the implanted species does not exceed one atomic percent.

Informaciones generales

  •  : Retirada
     : 2003-04
    : Retirada de la Norma Internacional [95.99]
  •  : 1
     : 4
  • ISO/TC 201/SC 6
    71.040.40 
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