Resumen
This document specifies the calibration and adjustment of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement standards.
Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.
Informaciones generales
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Estado: PublicadoFecha de publicación: 2021-12Etapa: Norma Internacional para revisar [90.92]
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Edición: 2Número de páginas: 20
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Comité Técnico :ISO/TC 213ICS :17.040.30
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Ciclo de vida
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Anteriormente
RetiradaISO 12179:2000
RetiradaISO 12179:2000/Cor 1:2003
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Ahora
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Será reemplazada por
En desarrolloISO/DIS 12179