ISO 14594:2014
2014-10
Resumen
ISO 14594:2014 gives the general guidelines for the determination of experimental parameters relating to the primary beam, the wavelength spectrometer, and the sample that need to be taken into account when carrying out electron probe microanalysis. It also defines procedures for the determination of beam current, current density, dead time, wavelength resolution, background, analysis area, analysis depth, and analysis volume.
It is intended for the analysis of a well-polished sample using normal beam incidence, and the parameters obtained can only be indicative for other experimental conditions.
It is not designed to be used for energy dispersive X-ray spectroscopy.
Informaciones generales
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Estado: PublicadoFecha de publicación: 2014-10Etapa: Norma Internacional para revisar [90.92]
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Edición: 2Número de páginas: 18
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Comité Técnico :ISO/TC 202/SC 2ICS :71.040.50
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Ciclo de vida
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Anteriormente
RetiradaISO 14594:2003
RetiradaISO 14594:2003/Cor 1:2009
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Ahora
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Revisada por
En desarrolloISO 14594
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