ISO 6342:1993
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Reference number
ISO 6342:1993
Edición 1
1993-08
Retirada
ISO 6342:1993
12641
Retirada (Edición 1, 1993)

Resumen

The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.

Informaciones generales

  •  : Retirada
     : 1993-08
    : Retirada de la Norma Internacional [95.99]
  •  : 1
     : 3
  • ISO/TC 171/SC 2
    37.080 
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