International Standard
ISO 24173:2024
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
Reference number
ISO 24173:2024
Edition 2
2024-02
International Standard
Read sample
ISO 24173:2024
82749
Published (Edition 2, 2024)

ISO 24173:2024

ISO 24173:2024
82749
Language
Format
CHF 173
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Abstract

This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

General information

  •  : Published
     : 2024-02
    : International Standard published [60.60]
  •  : 2
     : 40
  • ISO/TC 202
    71.040.50 
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