Status : Published (To be revised)

This standard will be replaced by ISO/FDIS 14594
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Abstract

ISO 14594:2014 gives the general guidelines for the determination of experimental parameters relating to the primary beam, the wavelength spectrometer, and the sample that need to be taken into account when carrying out electron probe microanalysis. It also defines procedures for the determination of beam current, current density, dead time, wavelength resolution, background, analysis area, analysis depth, and analysis volume.

It is intended for the analysis of a well-polished sample using normal beam incidence, and the parameters obtained can only be indicative for other experimental conditions.

It is not designed to be used for energy dispersive X-ray spectroscopy.

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General information

  • Status
     : Published
    Publication date
     : 2014-10
    Stage
    : International Standard to be revised [90.92]
  • Edition
     : 2
    Number of pages
     : 18
  • Technical Committee :
    ISO/TC 202/SC 2
    ICS :
    71.040.50 
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