Фильтр :
Стандарт и/или проект находящийся в компетенции ISO/TC 201/SC 9 Секретариата Этап ICS
Surface chemical analysis — Scanning-probe microscopy — Measurement of drift rate
90.93
Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
90.93
Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
95.99
Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
60.60
Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
90.93
Surface Chemical Analysis — Atomic force microscopy — Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
90.93
Guideline to describe AFM probe properties
10.99
Surface chemical analysis — Atomic force microscopy — Guideline for quantitative nanoscale potential measurement by Kelvin probe force microscopy
10.99
Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
60.60
Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
20.99
Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
60.60
Surface chemical analysis — Scanning-probe microscopy — Definition and calibration of the lateral resolution of a near-field optical microscope
90.93

По запросу ничего не найдено. Пожалуйста, попробуйте изменить настройки фильтра.